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Automated Redundant Via Insertion Targets Advanced-Node Resistance and Reliability

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Shehab Ashraf
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Signoff-aware via insertion can lower interconnect resistance and improve current sharing by moving reliability checks into implementation.

Automated Redundant Via Insertion Targets Advanced-Node Resistance and Reliability

At advanced process nodes, interconnects can set the limits on power, performance and area. Vias deserve particular attention: these vertical links between metal layers can contribute substantial resistance, and dense layouts leave little room to add redundancy by hand. Moving signoff-aware via optimization into implementation offers a way to strengthen connections before late design changes disrupt timing closure.

Why vias constrain reliability

A via’s small dimensions can make its resistance significant compared with that of a corresponding length of metal wire. As current passes through it, localized heating and atomic movement can contribute to electromigration (EM), gradually creating voids or shorts. Higher current density compounds the concern.

Via resistance also accumulates across a power delivery network (PDN). The resulting voltage drop, or IR drop, can leave logic gates with less voltage than intended. Their switching may slow enough to affect timing, or, in severe cases described in the source, a gate may not switch.

Redundant vias address both problems by creating parallel current paths. That reduces the effective resistance and shares current across multiple connections. Designers have traditionally added them manually to selected signal paths and power grids, but the density of layouts at 5nm and below, together with complex foundry rules, makes this approach difficult to apply across a large design.

A high-density layout view showing the intricate metal and via layers of an advanced-node design, highlighting the limited space available for enhancement. Source: Siemens.

Fig. 1: Dense advanced-node layouts leave limited space for redundant vias, which must be placed without violating foundry rules.

Why router insertion can fall short

Place-and-route (P&R) tools commonly offer basic via redundancy, but their main priorities are connectivity and timing closure. Their working design rules may be simplified to keep routing efficient, so a change that appears valid during implementation can trigger a design rule check (DRC) violation under the full signoff rule deck.

Congestion creates another limit. Routers may avoid inserting vias in crowded regions to prevent shorts, leaving some of the most constrained areas without extra paths. If an enhancement fails signoff, teams may need an engineering change order (ECO) and another implementation cycle. Those late iterations consume schedule and can disturb timing closure.

A shift-left flow brings signoff-quality geometry checks into the enhancement stage. The intent is to identify legal insertion sites using the same level of rule awareness expected at final verification, reducing the chance that added vias create downstream violations.

Finding legal sites early

A dedicated enhancement platform can work on the design database during implementation, reading formats such as LEF/DEF or OASIS. It first analyzes the layout for places where redundant vias can be added. That analysis must account for more than physical proximity: multi-patterning constraints, voltage-aware spacing rules and enclosure requirements all affect whether a location is legal.

After identifying valid sites, the tool inserts vias on nets selected by the design team. The scope can cover a power grid or focus on particular signal nets, including clock trees and long-distance buses. The goal is to lower resistance and improve EM margin while keeping the resulting geometry within applicable rules.

Diagram comparing a traditional linear signoff flow with the Calibre DesignEnhancer flow. The traditional flow, via insertion and EMIR analysis occur late. The "Shift-left" methodology, performs via insertion earlier, before signoff circuit (LVS) verification. Credit: Siemens.

Fig. 2: Moving via optimization into implementation gives teams an earlier opportunity to address interconnect issues.

Working with imperfect layouts

Implementation databases are often still changing and may contain routing overlaps, localized shorts or incomplete power grid definitions. An enhancement tool that requires a perfectly clean layout can stall as a result. The described short-resilient approach detects regions with existing connectivity conflicts and marks them as keep-out areas for via insertion.

That lets the tool continue working on clean regions while avoiding locations where an added connection could worsen a suspected short. Teams can therefore run enhancement earlier and repeat it as the layout develops, rather than waiting for every part of the design to be DRC-clean.

A three part flowchart showing the process of avoiding via insertion on short-prone areas. 1-Early detection: analysis of LEF/DEF files to detect existing shorts. 2-Isolating shorts: A layout diagram shows a vertical metal line intersecting two horizontal metal lines; the intersection with a detected short is highlighted in red to isolate it. 3-DE Via run: The Calibre DesignEnhancer (DE) Via run, where a new via (highlighted in green) is successfully inserted on a clean intersection, while the tool avoids placing a via on the previously identified red short-prone region. Credit: Siemens

Fig. 3: The short-resilient flow avoids insertion in identified conflict regions and continues on clean intersections.

Effects on power and current sharing

In a high-performance SoC, a PDN must distribute substantial current while limiting voltage drop. As the number of metal layers grows, resistance through stacked vias can form a significant part of the vertical path. Adding legal vias can reduce that impedance and make voltage distribution across the die more uniform, which may give logic more timing margin.

Extra paths also spread current among connections. Since manufacturing variation can create local current-density hot spots, redundancy can help reduce the load on an individual via and improve the margin against EM-related damage over a device’s lifetime. The result depends on the actual design and analysis; via count alone does not establish a particular IR-drop or lifetime improvement.

Scaling within the design flow

Large SoCs may contain billions of transistors and tens of kilometers of wiring, so enhancement has to fit within implementation schedules. The described platforms use parallel processing to divide layout analysis and insertion across CPU cores, with the aim of handling large databases within an overnight run.

Support for standard design formats and reporting on inserted vias helps teams review the changes in their existing EDA flow. Designers can also compare scenarios, such as different via densities, and examine their effects on IR drop to weigh reliability against power, performance and area constraints.

As designs move through 5nm, 3nm and smaller nodes, via optimization illustrates why implementation and verification increasingly need to share rule-aware checks. The practical value is earlier feedback: teams can assess legal redundancy while the layout is still being built, when there is more room to address resistance and current-sharing concerns.

Source: Shehab Ashraf · semiengineering.com

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